Supervised classification methods for flash X-ray single particle diffraction imaging
Abstract
Current Flash X-ray single-particle diffraction Imaging (FXI) experiments, which operate on modern X-ray Free Electron Lasers (XFELs), can record millions of interpretable diffraction patterns from individual biomolecules per day. Due to the stochastic nature of the XFELs, those patterns will to a varying degree include scatterings from contaminated samples. Also, the heterogeneity of the sample biomolecules is unavoidable and complicates data processing. Reducing the data volumes and selecting high-quality single-molecule patterns are therefore critical steps in the experimental set-up. In this paper, we present two supervised template-based learning methods for classifying FXI patterns. Our Eigen-Image and Log-Likelihood classifier can find the best-matched template for a single-molecule pattern within a few milliseconds. It is also straightforward to parallelize them so as to fully match the XFEL repetition rate, thereby enabling processing at site.
- Publication:
-
Optics Express
- Pub Date:
- February 2019
- DOI:
- 10.1364/OE.27.003884
- arXiv:
- arXiv:1810.10786
- Bibcode:
- 2019OExpr..27.3884L
- Keywords:
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- Computer Science - Computer Vision and Pattern Recognition;
- Statistics - Machine Learning
- E-Print:
- doi:10.1364/OE.27.003884