Tutorial: Time-domain thermoreflectance (TDTR) for thermal property characterization of bulk and thin film materials

Measuring thermal properties of materials is not only of fundamental importance in understanding the transport processes of energy carriers (electrons and phonons in solids) but also of practical interest in developing novel materials with desired thermal properties for applications in energy conversion and storage, electronics, and photonic systems. Over the past two decades, ultrafast laser-based time-domain thermoreflectance (TDTR) has emerged and evolved as a reliable, powerful, and versatile technique to measure the thermal properties of a wide range of bulk and thin film materials and their interfaces. This tutorial discusses the basics as well as the recent advances of the TDTR technique and its applications in the thermal characterization of a variety of materials. The tutorial begins with the fundamentals of the TDTR technique, serving as a guideline for understanding the basic principles of this technique. Several variations of the TDTR technique that function similarly as the standard TDTR but with their own unique features are introduced, followed by introducing different advanced TDTR configurations that were developed to meet different measurement conditions. This tutorial closes with a summary that discusses the current limitations and proposes some directions for future development.