A Note on Polynomial Identity Testing for Depth-3 Circuits
Abstract
Let $C$ be a depth-3 arithmetic circuit of size at most $s$, computing a polynomial $ f \in \mathbb{F}[x_1,\ldots, x_n] $ (where $\mathbb{F}$ = $\mathbb{Q}$ or $\mathbb{C}$) and the fan-in of the product gates of $C$ is bounded by $d$. We give a deterministic polynomial identity testing algorithm to check whether $f\equiv 0$ or not in time $ 2^d \text{ poly}(n,s) $.
- Publication:
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arXiv e-prints
- Pub Date:
- May 2018
- DOI:
- 10.48550/arXiv.1805.06692
- arXiv:
- arXiv:1805.06692
- Bibcode:
- 2018arXiv180506692A
- Keywords:
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- Computer Science - Computational Complexity
- E-Print:
- Result for finite fields has been added