Reconstruction of partially sampled multi-band images - Application to STEM-EELS imaging
Abstract
Electron microscopy has shown to be a very powerful tool to map the chemical nature of samples at various scales down to atomic resolution. However, many samples can not be analyzed with an acceptable signal-to-noise ratio because of the radiation damage induced by the electron beam. This is particularly crucial for electron energy loss spectroscopy (EELS) which acquires spectral-spatial data and requires high beam intensity. Since scanning transmission electron microscopes (STEM) are able to acquire data cubes by scanning the electron probe over the sample and recording a spectrum for each spatial position, it is possible to design the scan pattern and to sample only specific pixels. As a consequence, partial acquisition schemes are now conceivable, provided a reconstruction of the full data cube is conducted as a post-processing step. This paper proposes two reconstruction algorithms for multi-band images acquired by STEM-EELS which exploits the spectral structure and the spatial smoothness of the image. The performance of the proposed schemes is illustrated thanks to experiments conducted on a realistic phantom dataset as well as real EELS spectrum-images.
- Publication:
-
arXiv e-prints
- Pub Date:
- February 2018
- DOI:
- 10.48550/arXiv.1802.10066
- arXiv:
- arXiv:1802.10066
- Bibcode:
- 2018arXiv180210066M
- Keywords:
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- Electrical Engineering and Systems Science - Image and Video Processing;
- Condensed Matter - Materials Science;
- Computer Science - Computer Vision and Pattern Recognition;
- Physics - Data Analysis;
- Statistics and Probability