Entanglement across extended random defects in the XX spin chain
Abstract
We study the half-chain entanglement entropy in the ground state of the spin-1/2 XX chain across an extended random defect, where the strength of disorder decays with the distance from the interface algebraically as Δ_l∼ l-κ . In the whole regime κ≥slant 0 , the average entanglement entropy is found to increase logarithmically with the system size L as S_L≃\frac{c_eff(κ)}{6}\ln L+const , where the effective central charge c_eff(κ) depends on κ. In the regime κ<1/2 , where the extended defect is a relevant perturbation, the strong-disorder renormalization group method gives c_eff(κ)=(1-2κ)\ln2 , while, in the regime κ≥slant 1/2 , where the extended defect is irrelevant in the bulk, numerical results indicate a non-zero effective central charge, which increases with κ. The variation of c_eff(κ) is thus found to be non-monotonic and discontinuous at κ=1/2 .
- Publication:
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Journal of Statistical Mechanics: Theory and Experiment
- Pub Date:
- August 2017
- DOI:
- 10.1088/1742-5468/aa819b
- arXiv:
- arXiv:1706.05915
- Bibcode:
- 2017JSMTE..08.3107J
- Keywords:
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- Condensed Matter - Disordered Systems and Neural Networks;
- Condensed Matter - Statistical Mechanics;
- Quantum Physics
- E-Print:
- 16 pages, 8 figures