A HEMT-Based Cryogenic Charge Amplifier with sub-100 eVee Ionization Resolution for Massive Semiconductor Dark Matter Detectors
Abstract
We present the measured baseline ionization resolution of a HEMT-based cryogenic charge amplifier coupled to a CDMS-II detector. The amplifier has been developed to allow massive semiconductor dark matter detectors to retain background discrimination at the low recoil energies produced by low-mass WIMPs. We find a calibrated baseline ionization resolution of $\sigma_E = 91\,\text{eV}_{ee}$. To our knowledge, this is the best direct ionization resolution achieved with such massive ($\approx$150 pF capacitance) radiation detectors.
- Publication:
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arXiv e-prints
- Pub Date:
- November 2016
- DOI:
- 10.48550/arXiv.1611.09712
- arXiv:
- arXiv:1611.09712
- Bibcode:
- 2016arXiv161109712P
- Keywords:
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- Physics - Instrumentation and Detectors;
- Astrophysics - Instrumentation and Methods for Astrophysics
- E-Print:
- Published in Nuclear Instruments and Methods in Physics Research Section A