Hard Negative Mining for Metric Learning Based Zero-Shot Classification
Abstract
Zero-Shot learning has been shown to be an efficient strategy for domain adaptation. In this context, this paper builds on the recent work of Bucher et al. [1], which proposed an approach to solve Zero-Shot classification problems (ZSC) by introducing a novel metric learning based objective function. This objective function allows to learn an optimal embedding of the attributes jointly with a measure of similarity between images and attributes. This paper extends their approach by proposing several schemes to control the generation of the negative pairs, resulting in a significant improvement of the performance and giving above state-of-the-art results on three challenging ZSC datasets.
- Publication:
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arXiv e-prints
- Pub Date:
- August 2016
- DOI:
- 10.48550/arXiv.1608.07441
- arXiv:
- arXiv:1608.07441
- Bibcode:
- 2016arXiv160807441B
- Keywords:
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- Computer Science - Machine Learning;
- Computer Science - Artificial Intelligence;
- Computer Science - Computer Vision and Pattern Recognition;
- Statistics - Machine Learning
- E-Print:
- ECCV 16 WS TASK-CV: Transferring and Adapting Source Knowledge in Computer Vision, Oct 2016, Amsterdam, Netherlands. ECCV 16 WS TASK-CV: Transferring and Adapting Source Knowledge in Computer Vision