Exponential Orthogonality Catastrophe at the Anderson Metal-Insulator Transition
Abstract
We consider the orthogonality catastrophe at the Anderson metal-insulator transition (AMIT). The typical overlap F between the ground state of a Fermi liquid and the one of the same system with an added potential impurity is found to decay at the AMIT exponentially with system size L as F ∼exp (-c Lη) , where η is the power of multifractal intensity correlations. Thus, strong disorder typically increases the sensitivity of a system to an added impurity exponentially. We recover, on the metallic side of the transition, Anderson's result that the fidelity F decays with a power law F ∼L-q (EF) with system size L . Its power increases as the Fermi energy EF approaches the mobility edge EM as q (EF)∼[(EF-EM )/EM]-ν η , where ν is the critical exponent of the correlation length ξc. On the insulating side of the transition, F is constant for system sizes exceeding the localization length ξ . While these results are obtained for the typical fidelity F , we find that log F is widely, log normally, distributed with a width diverging at the AMIT. As a consequence, the mean value of the fidelity F converges to one at the AMIT, in strong contrast to its typical value which converges to zero exponentially fast with system size L . This counterintuitive behavior is explained as a manifestation of multifractality at the AMIT.
- Publication:
-
Physical Review Letters
- Pub Date:
- September 2016
- DOI:
- 10.1103/PhysRevLett.117.146602
- arXiv:
- arXiv:1606.02243
- Bibcode:
- 2016PhRvL.117n6602K
- Keywords:
-
- Condensed Matter - Disordered Systems and Neural Networks;
- Condensed Matter - Strongly Correlated Electrons
- E-Print:
- 4 pages, 4 figures