Schottky barrier and contact resistance of InSb nanowire field-effect transistors
Abstract
Understanding of the electrical contact properties of semiconductor nanowire (NW) field-effect transistors (FETs) plays a crucial role in the use of semiconducting NWs as building blocks for future nanoelectronic devices and in the study of fundamental physics problems. Here, we report on a study of the contact properties of Ti/Au, a widely used contact metal combination, when contacting individual InSb NWs via both two-probe and four-probe transport measurements. We show that a Schottky barrier of height {{{Φ }}}{{SB}}∼ 20 {{meV}} is present at the metal-InSb NW interfaces and its effective height is gate-tunable. The contact resistance ({R}{{c}}) in the InSb NWFETs is also analyzed by magnetotransport measurements at low temperatures. It is found that {R}{{c}} in the on-state exhibits a pronounced magnetic field-dependent feature, namely it is increased strongly with increasing magnetic field after an onset field {B}{{c}}. A qualitative picture that takes into account magnetic depopulation of subbands in the NWs is provided to explain the observation. Our results provide solid experimental evidence for the presence of a Schottky barrier at Ti/Au-InSb NW interfaces and can be used as a basis for design and fabrication of novel InSb NW-based nanoelectronic devices and quantum devices.
- Publication:
-
Nanotechnology
- Pub Date:
- July 2016
- DOI:
- 10.1088/0957-4484/27/27/275204
- arXiv:
- arXiv:1605.08689
- Bibcode:
- 2016Nanot..27A5204F
- Keywords:
-
- Condensed Matter - Mesoscale and Nanoscale Physics
- E-Print:
- 12 pages, 4 figures