Efficient treatment of stacked metasurfaces for optimizing and enhancing the range of accessible optical functionalities
Abstract
We present, discuss, and validate an adapted S -matrix formalism for an efficient, simplified treatment of stacked homogeneous periodically structured metasurfaces operated under normally incident plane wave excitation. The proposed formalism can be applied to any material system, arbitrarily shaped metaatoms, at any frequency, and with arbitrary subwavelength periods. Circumventing the introduction of any kind of effective parameters we directly use the S parameters of the individual metasurfaces to calculate the response of an arbitrary stack. In fact, the S parameters are the complex parameters of choice fully characterizing the homogeneous metasurfaces, in particular with respect to its polarization manipulating properties. Just as effective material parameters like the permittivity and the permeability or wave parameters like the propagation constant and the impedance, the stacking based upon S matrices can be applied as long as the individual layers are decoupled with respect to their near fields. This requirement eventually sets the limits for using the optical properties of the individual layers to calculate the response of the stacked system—this being the conceptual aim for any homogeneous metasurface or metamaterial layer and therefore the essence of what is eventually possible with homogeneous metasurfaces. As simple and appealing as this approach is, it is as powerful as well: Combining structured metasurfaces with each other as well as with isotropic, anisotropic, or chiral homogeneous layers is possible by simple semianalytical S -matrix multiplication. Hence, complex stacks and resonators can be set up, accurately treated and optimized with respect to their dispersive polarization sensitive optical functionality without the need for further rigorous full-wave simulations.
- Publication:
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Physical Review A
- Pub Date:
- June 2016
- DOI:
- 10.1103/PhysRevA.93.063832
- arXiv:
- arXiv:1511.09239
- Bibcode:
- 2016PhRvA..93f3832M
- Keywords:
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- Physics - Optics
- E-Print:
- Phys. Rev. A 93, 063832 (2016)