Spin susceptibility of Anderson impurities in arbitrary conduction bands
Abstract
Spin susceptibility of Anderson impurities is a key quantity in understanding the physics of Kondo screening. Traditional numerical renormalization group (NRG) calculation of the impurity contribution χimp to susceptibility, defined originally by Wilson in a flat wide band, has been generalized before to structured conduction bands. The results brought about non-Fermi-liquid and diamagnetic Kondo behaviors in χimp, even when the bands are not gapped at the Fermi energy. Here, we use the full density-matrix (FDM) NRG to present high-quality data for the local susceptibility χloc and to compare them with χimp obtained by the traditional NRG. Our results indicate that those exotic behaviors observed in χimp are unphysical. Instead, the low-energy excitations of the impurity in arbitrary bands only without gap at the Fermi energy are still a Fermi liquid and paramagnetic. We also demonstrate that unlike the traditional NRG yielding χloc less accurate than χimp, the FDM method allows a high-precision dynamical calculation of χloc at much reduced computational cost, with an accuracy at least one order higher than χimp. Moreover, artifacts in the FDM algorithm to χimp and origins of the spurious non-Fermi-liquid and diamagnetic features are clarified. Our work provides an efficient high-precision algorithm to calculate the spin susceptibility of impurity for arbitrary structured bands, while negating the applicability of Wilson's definition to such cases.
- Publication:
-
Physical Review B
- Pub Date:
- October 2015
- DOI:
- 10.1103/PhysRevB.92.155129
- arXiv:
- arXiv:1507.07414
- Bibcode:
- 2015PhRvB..92o5129F
- Keywords:
-
- 71.27.+a;
- 75.20.Hr;
- 05.10.Cc;
- Strongly correlated electron systems;
- heavy fermions;
- Local moment in compounds and alloys;
- Kondo effect valence fluctuations heavy fermions;
- Renormalization group methods;
- Condensed Matter - Strongly Correlated Electrons;
- Condensed Matter - Mesoscale and Nanoscale Physics
- E-Print:
- the published version