Localization length of nearly periodic layered metamaterials
Abstract
We have analyzed numerically the localization length of light ξ for nearly periodic arrangements of homogeneous stacks (formed exclusively by right-handed materials) and mixed stacks (with alternating right- and left-handed metamaterials). Layers with index of refraction n1 and thickness L1 alternate with layers of index of refraction n2 and thickness L2. Positional disorder has been considered by shifting randomly the positions of the layer boundaries with respect to periodic values. For homogeneous stacks, we have shown that the localization length is modulated by the corresponding bands and that ξ is enhanced at the center of each allowed band. In the limit of long wavelengths λ, the parabolic behavior previously found in purely disordered systems is recovered, whereas for λ≪L1+L2 a saturation is reached. In the case of nearly periodic mixed stacks with the condition |n1L1|=|n2L2|, instead of bands there is a periodic arrangement of Lorenztian resonances, which again is reflected in the behavior of the localization length. For wavelengths of several orders of magnitude greater than L1+L2, the localization length ξ depends linearly on λ with a slope inversely proportional to the modulus of the reflection amplitude between alternating layers. When the condition |n1L1|=|n2L2| is no longer satisfied, the transmission spectrum is very irregular and this considerably affects the localization length.
- Publication:
-
Physical Review A
- Pub Date:
- August 2012
- DOI:
- 10.1103/PhysRevA.86.023846
- arXiv:
- arXiv:1506.00297
- Bibcode:
- 2012PhRvA..86b3846D
- Keywords:
-
- 42.25.Dd;
- 42.25.Fx;
- 42.25.Hz;
- Wave propagation in random media;
- Diffraction and scattering;
- Interference;
- Physics - Optics
- E-Print:
- Physical Review A 86, 023846 (2012)