Fourier transform analysis of STM images of multilayer graphene moiré patterns
Abstract
With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moiré patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.
- Publication:
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Carbon
- Pub Date:
- March 2015
- DOI:
- 10.1016/j.carbon.2014.11.030
- arXiv:
- arXiv:1409.3105
- Bibcode:
- 2015Carbo..83...48J
- Keywords:
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- Condensed Matter - Mesoscale and Nanoscale Physics
- E-Print:
- Submitted to Carbon