Pattern recognition at different scales: A statistical perspective
Abstract
In this paper we borrow concepts from Information Theory and Statistical Mechanics to perform a pattern recognition procedure on a set of x-ray hazelnut images. We identify two relevant statistical scales, whose ratio affects the performance of a machine learning algorithm based on statistical observables, and discuss the dependence of such scales on the image resolution. Finally, by averaging the performance of a Support Vector Machines algorithm over a set of training samples, we numerically verify the predicted onset of an optimal scale of resolution, at which the pattern recognition is favoured.
- Publication:
-
Chaos Solitons and Fractals
- Pub Date:
- July 2014
- DOI:
- 10.1016/j.chaos.2013.10.006
- arXiv:
- arXiv:1404.2638
- Bibcode:
- 2014CSF....64...48C
- Keywords:
-
- Condensed Matter - Statistical Mechanics;
- Condensed Matter - Disordered Systems and Neural Networks
- E-Print:
- doi:10.1016/j.chaos.2013.10.006