Standardization of surface potential measurements of graphene domains
Abstract
We compare the three most commonly used scanning probe techniques to obtain a reliable value of the work function in graphene domains of different thickness. The surface potential (SP) of graphene is directly measured in Hall bar geometry via a combination of electrical functional microscopy and spectroscopy techniques, which enables calibrated work function measurements of graphene domains in ambient conditions with values Φ1LG ~4.55 +/- 0.02 eV and Φ2LG ~ 4.44 +/- 0.02 eV for single- and bi-layer, respectively. We demonstrate that frequency-modulated Kelvin probe force microscopy (FM-KPFM) provides more accurate measurement of the SP than amplitude-modulated (AM)-KPFM. The discrepancy between experimental results obtained by different techniques is discussed. In addition, we use FM-KPFM for contactless measurements of the specific components of the device resistance. We show a strong non-Ohmic behavior of the electrode-graphene contact resistance and extract the graphene channel resistivity.
- Publication:
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Scientific Reports
- Pub Date:
- September 2013
- DOI:
- 10.1038/srep02597
- arXiv:
- arXiv:1305.0465
- Bibcode:
- 2013NatSR...3E2597P
- Keywords:
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- Condensed Matter - Mesoscale and Nanoscale Physics