On circular Bragg regimes in ellipsometry spectra of ambichiral sculptured thin films
Abstract
The generalized ellipsometry formalism was used for a right-handed ambichiral sculptured thin film. The amplitude ratios and phase differences were calculated using an experimental dielectric function for bulk titania. The results showed that the occurrence of the circular Bragg regimes can be adduced from ellipsometry spectra.
- Publication:
-
Journal of Modern Optics
- Pub Date:
- June 2013
- DOI:
- 10.1080/09500340.2013.821532
- arXiv:
- arXiv:1302.2382
- Bibcode:
- 2013JMOp...60..886B
- Keywords:
-
- sculptured thin film;
- ellipsometry;
- Physics - Optics
- E-Print:
- 3 figures. arXiv admin note: substantial text overlap with arXiv:1206.0427