Multiple ionization of neon by soft x-rays at ultrahigh intensity
Abstract
At the free-electron laser FLASH, multiple ionization of neon atoms was quantitatively investigated at photon energies of 93.0 and 90.5 eV. For ion charge states up to 6+, we compare the respective absolute photoionization yields with results from a minimal model and an elaborate description including standard sequential and direct photoionization channels. Both approaches are based on rate equations and take into account a Gaussian spatial intensity distribution of the laser beam. From the comparison we conclude that photoionization up to a charge of 5+ can be described by the minimal model which we interpret as sequential photoionization assisted by electron shake-up processes. For higher charges, the experimental ionization yields systematically exceed the elaborate rate-based prediction.
- Publication:
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Journal of Physics B Atomic Molecular Physics
- Pub Date:
- August 2013
- DOI:
- 10.1088/0953-4075/46/16/164025
- arXiv:
- arXiv:1302.0021
- Bibcode:
- 2013JPhB...46p4025G
- Keywords:
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- Physics - Atomic Physics
- E-Print:
- 10 pages, 3 figures