Optimization of the X-ray incidence angle in photoelectron spectrometers
Abstract
The interplay between X-ray reflectivity, X-ray absorption and photoelectron attenuation in the photoelectron emission process is analyzed. The optimal X-ray incidence angle to maximize the photoelectron signal is evaluated in a wide VUV to hard X-ray energy range.
- Publication:
-
Journal of Synchrotron Radiation
- Pub Date:
- May 2013
- DOI:
- 10.1107/S0909049513007747
- arXiv:
- arXiv:1212.3819
- Bibcode:
- 2013JSynR..20..517S
- Keywords:
-
- photoemission;
- X-ray absorption;
- photoelectron attenuation;
- photoelectron spectrometers;
- Physics - Instrumentation and Detectors;
- Condensed Matter - Materials Science
- E-Print:
- 6 pages, 3 figures