Complex Permittivity Measurements at Variable Temperatures of Low Loss Dielectric Substrates Employing Split Post and Single Post Dielectric Resonators
Abstract
A split post dielectric resonator in a copper enclosure and a single post dielectric resonator in a cavity with superconducting end-plates have been constructed and used for the complex permittivity measurements of single crystal substrates. (La,Sr)(Al,Ta)O3, LaAlO3, MgO and quartz substrates have been measured at temperatures from 20 K to 300 K in the split post resonator and from 15 K to 80 K in the single post resonator. The TE01delta mode resonant frequencies and unloaded Qo-factors of the empty resonators at temperature of 20 K were: 9.952 GHz and 25,000 for the split post resonator and 10.808 GHz and 240,000 for the single post resonator respectively.
- Publication:
-
arXiv e-prints
- Pub Date:
- September 2012
- DOI:
- 10.48550/arXiv.1209.0111
- arXiv:
- arXiv:1209.0111
- Bibcode:
- 2012arXiv1209.0111M
- Keywords:
-
- Condensed Matter - Materials Science;
- Physics - Instrumentation and Detectors
- E-Print:
- 4 pages, 8 figures, 1 table