Ultra-low-phase-noise cryocooled microwave dielectric-sapphire-resonator oscillators
Abstract
Two nominally identical ultra-stable microwave oscillators are compared. Each incorporates a sapphire resonator cooled to near 6 K in an ultra-low vibration cryostat using a pulse-tube cryocooler. The phase noise for a single oscillator is measured at -105 dBc/Hz at 1 Hz offset on the 11.2 GHz carrier. The oscillator fractional frequency stability, after subtracting a linear frequency drift of 3.5×10-14/day, is characterized by 5.3×10-16τ-1/2+9×10-17 for integration times 0.1s<τ<1000s and is limited by a flicker frequency noise floor near 1×10-16.
- Publication:
-
Applied Physics Letters
- Pub Date:
- April 2012
- DOI:
- 10.1063/1.4709479
- arXiv:
- arXiv:1202.2206
- Bibcode:
- 2012ApPhL.100r3501H
- Keywords:
-
- cryogenics;
- microwave oscillators;
- microwave resonators;
- phase noise;
- sapphire;
- 84.30.Ng;
- 84.40.-x;
- 84.40.Az;
- 07.20.Mc;
- Oscillators pulse generators and function generators;
- Radiowave and microwave technology;
- Waveguides transmission lines striplines;
- Cryogenics;
- refrigerators low-temperature detectors and other low-temperature equipment;
- Physics - Instrumentation and Detectors
- E-Print:
- 4 pages, 5 figures