Scanning probe microscopy imaging of metallic nanocontacts
Abstract
We show scanning probe microscopy measurements of metallic nanocontacts between controlled electromigration cycles. The nanowires used for the thinning process are fabricated by shadow evaporation. The highest resolution obtained using scanning force microscopy is about 3 nm. During the first few electromigration cycles the overall slit structure of the nanocontact is formed. The slit first passes along grain boundaries and then at a later stage vertically splits grains in the course of consuming them. We find that first the whole wire is heated, and later during the thinning process as the slit forms the current runs over several smaller contacts and less power is needed.
- Publication:
-
Physical Review B
- Pub Date:
- January 2012
- DOI:
- 10.1103/PhysRevB.85.033404
- arXiv:
- arXiv:1112.6309
- Bibcode:
- 2012PhRvB..85c3404S
- Keywords:
-
- 73.40.Jn;
- 73.22.-f;
- 73.63.Rt;
- 85.65.+h;
- Metal-to-metal contacts;
- Electronic structure of nanoscale materials: clusters nanoparticles nanotubes and nanocrystals;
- Nanoscale contacts;
- Molecular electronic devices;
- Condensed Matter - Mesoscale and Nanoscale Physics;
- Condensed Matter - Materials Science
- E-Print:
- 4 pages, 4 figures