Note: Vector reflectometry in a beam waveguide
Abstract
We present a one-port calibration technique for characterization of beam waveguide components with a vector network analyzer. This technique involves using a set of known delays to separate the responses of the instrument and the device under test. We demonstrate this technique by measuring the reflected performance of a millimeter-wave variable-delay polarization modulator.
- Publication:
-
Review of Scientific Instruments
- Pub Date:
- August 2011
- DOI:
- 10.1063/1.3622522
- arXiv:
- arXiv:1107.2453
- Bibcode:
- 2011RScI...82h6101E
- Keywords:
-
- calibration;
- microwave reflectometry;
- network analysers;
- waveguide components;
- 84.40.Az;
- 06.20.fb;
- Waveguides transmission lines striplines;
- Standards and calibration;
- Astrophysics - Instrumentation and Methods for Astrophysics
- E-Print:
- Rev. Sci. Instrum. 82 , 086101 (2011)