A Simple Model to Measure Linewidth Enhancement Factor (\alpha) for Multi-wavelengths Semiconductor Laser
Abstract
A novel and simple model is proposed for the measurement of the linewidth enhancement factor (LEF) {\alpha} of multiwavelengths semiconductor laser. It is based on the suppression characteristics of an arbitrary mode while other modes are optically injection locked individually. The proposed model can be used to measure {\alpha} value of individual modes of multi-wavelengths laser with large mode spacing. As a proof of the concept, the model is used to experimentally measure {\alpha} of a mode of a slotted Fabry- Pérot laser source.
- Publication:
-
arXiv e-prints
- Pub Date:
- June 2011
- DOI:
- 10.48550/arXiv.1106.3676
- arXiv:
- arXiv:1106.3676
- Bibcode:
- 2011arXiv1106.3676M
- Keywords:
-
- Physics - Optics