Verifying entanglement in the Hong-Ou-Mandel dip
Abstract
The Hong-Ou-Mandel interference dip is caused by an entangled state, a delocalized biphoton state. We propose a method of detecting this entanglement by utilizing inverse Hong-Ou-Mandel interference, while taking into account vacuum and multiphoton contaminations, phase noise, and other imperfections. The method uses just linear optics and photodetectors, and for single-mode photodetectors we find a lower bound on the amount of entanglement.
- Publication:
-
Physical Review A
- Pub Date:
- April 2011
- DOI:
- arXiv:
- arXiv:1101.0846
- Bibcode:
- 2011PhRvA..83d2318R
- Keywords:
-
- 03.67.Bg;
- 42.50.Ex;
- 03.67.Mn;
- Entanglement production and manipulation;
- Optical implementations of quantum information processing and transfer;
- Entanglement production characterization and manipulation;
- Quantum Physics
- E-Print:
- 5 pages, 2 figures