Critical current diffraction pattern of SIFS Josephson junctions with step-like F-layer
Abstract
We present the latest generation of superconductor-insulator-ferromagnet-superconductor Josephson tunnel junctions with a step-like thickness of the ferromagnetic (F) layer. The F-layer thicknesses $d_1$ and $d_2$ in both halves were varied to obtain different combinations of positive and negative critical current densities $j_{c,1}$ and $j_{c,2}$. The measured dependences of the critical current on applied magnetic field can be well described by a model which takes into account different critical current densities (obtained from reference junctions) and different net magnetization of the multidomain ferromagnetic layer in both halves.
- Publication:
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arXiv e-prints
- Pub Date:
- June 2010
- DOI:
- 10.48550/arXiv.1006.5109
- arXiv:
- arXiv:1006.5109
- Bibcode:
- 2010arXiv1006.5109W
- Keywords:
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- Condensed Matter - Superconductivity
- E-Print:
- 7 pages, 3 figures