Multipartite entanglement and high-precision metrology
Abstract
We present several entanglement criteria in terms of the quantum Fisher information that help to relate various forms of multipartite entanglement to the sensitivity of phase estimation. We show that genuine multipartite entanglement is necessary to reach the maximum sensitivity in some very general metrological tasks using a two-arm linear interferometer. We also show that it is needed to reach the maximum average sensitivity in a certain combination of such metrological tasks.
- Publication:
-
Physical Review A
- Pub Date:
- February 2012
- DOI:
- 10.1103/PhysRevA.85.022322
- arXiv:
- arXiv:1006.4368
- Bibcode:
- 2012PhRvA..85b2322T
- Keywords:
-
- 03.67.Bg;
- 03.65.Ud;
- 42.50.St;
- Entanglement production and manipulation;
- Entanglement and quantum nonlocality;
- Nonclassical interferometry subwavelength lithography;
- Quantum Physics
- E-Print:
- 10 pages including 3 figures, revtex4