Strain-mediated metal-insulator transition in epitaxial ultrathin films of NdNiO3
Abstract
We have synthesized epitaxial NdNiO3 ultrathin films in a layer-by-layer growth mode under tensile and compressive strain on SrTiO3 (001) and LaAlO3 (001), respectively. A combination of x-ray diffraction, temperature dependent resistivity, and soft x-ray absorption spectroscopy has been applied to elucidate electronic and structural properties of the samples. In contrast to the bulk NdNiO3, the metal-insulator transition under compressive strain is found to be completely quenched, while the transition remains under the tensile strain albeit modified from the bulk behavior.
- Publication:
-
Applied Physics Letters
- Pub Date:
- June 2010
- DOI:
- 10.1063/1.3451462
- arXiv:
- arXiv:1003.3073
- Bibcode:
- 2010ApPhL..96w3110L
- Keywords:
-
- electrical resistivity;
- electromechanical effects;
- epitaxial layers;
- internal stresses;
- metal-insulator transition;
- neodymium compounds;
- X-ray absorption spectra;
- X-ray diffraction;
- 71.30.+h;
- 68.60.Bs;
- 78.70.Dm;
- Metal-insulator transitions and other electronic transitions;
- Mechanical and acoustical properties;
- X-ray absorption spectra;
- Condensed Matter - Strongly Correlated Electrons;
- Condensed Matter - Materials Science
- E-Print:
- 4 pages, 4 figures