Half-life of the electron-capture decay of Ru97: Precision measurement shows no temperature dependence
Abstract
We have measured the half-life of the electron-capture (ec) decay of Ru97 in a metallic environment, both at low temperature (19K), and also at room temperature. We find the half-lives at both temperatures to be the same within 0.1%. This demonstrates that a recent claim that the ec decay half-life for Be7 changes by 0.9%±0.2% under similar circumstances certainly cannot be generalized to other ec decays. Our results for the half-life of Ru97, 2.8370(14) d at room temperature and 2.8382(14) d at 19 K, are consistent with, but much more precise than, previous room-temperature measurements. In addition, we have also measured the half-lives of the β--emitters Ru103 and Rh105 at both temperatures, and found them also to be unchanged.
- Publication:
-
Physical Review C
- Pub Date:
- October 2009
- DOI:
- 10.1103/PhysRevC.80.045501
- arXiv:
- arXiv:0910.4338
- Bibcode:
- 2009PhRvC..80d5501G
- Keywords:
-
- 23.40.-s;
- 21.10.Tg;
- 27.60.+j;
- Beta decay;
- double beta decay;
- electron and muon capture;
- Lifetimes;
- 90<
- =A<
- =149;
- Nuclear Experiment
- E-Print:
- 6 pages, 6 figures