Anomalous Diffusion Mediated by Atom Deposition into a Porous Substrate
Abstract
Constant flux atom deposition into a porous medium is shown to generate a dense overlayer and a diffusion profile. Scaling analysis shows that the overlayer acts as a dynamic control for atomic diffusion in the porous substrate. This is modeled by generalizing the porous diffusion equation with a time-dependent diffusion coefficient equivalent to a nonlinear rescaling of time.
- Publication:
-
Physical Review Letters
- Pub Date:
- January 2009
- DOI:
- 10.1103/PhysRevLett.102.045901
- arXiv:
- arXiv:0902.2618
- Bibcode:
- 2009PhRvL.102d5901B
- Keywords:
-
- 66.30.Pa;
- 66.30.Dn;
- 68.55.-a;
- 81.15.Cd;
- Diffusion in nanoscale solids;
- Theory of diffusion and ionic conduction in solids;
- Thin film structure and morphology;
- Deposition by sputtering;
- Condensed Matter - Statistical Mechanics
- E-Print:
- 4 pages