Depth-dependent critical behavior in V2H
Abstract
Using x-ray diffuse scattering, we investigate the critical behavior of an order-disorder phase transition in a defective “skin layer” of V2H . In the skin layer, there exist walls of dislocation lines oriented normal to the surface. The density of dislocation lines within a wall decreases continuously with depth. We find that, because of this inhomogeneous distribution of defects, the transition effectively occurs at a depth-dependent local critical temperature. A depth-dependent scaling law is proposed to describe the corresponding critical ordering behavior.
- Publication:
-
Physical Review B
- Pub Date:
- May 2009
- DOI:
- 10.1103/PhysRevB.79.184113
- arXiv:
- arXiv:0902.2414
- Bibcode:
- 2009PhRvB..79r4113D
- Keywords:
-
- 61.05.cp;
- 64.60.Cn;
- 64.60.F-;
- 64.60.Kw;
- X-ray diffraction;
- Order-disorder transformations;
- statistical mechanics of model systems;
- Equilibrium properties near critical points critical exponents;
- Multicritical points;
- Condensed Matter - Materials Science;
- Condensed Matter - Statistical Mechanics
- E-Print:
- 5 pages, 4 figures