Maximizing the electric field strength in the foci of high numerical aperture optics
Abstract
Several applications require spatial distributions of the incident electric field that maximize the electric field at a focal point for a given input power. The field distributions are derived for various optical systems in a direct way based on fundamental physical properties. The results may prove useful for a wide range of applications, e.g., microscopy, scattering experiments or excitation of single atoms. For commonly used distributions - fundamental Gaussian modes and doughnut modes - we give the upper bounds of the achievable field amplitudes.
- Publication:
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arXiv e-prints
- Pub Date:
- November 2008
- DOI:
- 10.48550/arXiv.0811.2098
- arXiv:
- arXiv:0811.2098
- Bibcode:
- 2008arXiv0811.2098S
- Keywords:
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- Physics - Optics;
- Quantum Physics
- E-Print:
- 9 pages, 8 figures, rewritten Sec. II (contains now a revised derivation of the central formula which was in Sec. V in former versions), rewritten Sec. V (some additional examples added ->