Near-Edge X-Ray Absorption Fine-Structure Investigation of Graphene
Abstract
We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO2 substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single-layer graphene we observe a splitting of the π* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.
- Publication:
-
Physical Review Letters
- Pub Date:
- August 2008
- DOI:
- 10.1103/PhysRevLett.101.066806
- arXiv:
- arXiv:0805.2269
- Bibcode:
- 2008PhRvL.101f6806P
- Keywords:
-
- 73.20.At;
- 73.90.+f;
- Surface states band structure electron density of states;
- Other topics in electronic structure and electrical properties of surfaces interfaces thin films and low-dimensional structures;
- Condensed Matter - Materials Science
- E-Print:
- 5 pages, 4 figures