X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal
Abstract
X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism is used to investigate the influence of an applied magnetic field on Néel caps (i.e., surface terminations of asymmetric Bloch walls). Self-assembled micron-sized Fe(110) dots displaying a moderate distribution of size and aspect ratios serve as model objects. Investigations of remanent states after application of an applied field along the direction of Néel-cap magnetization give clear evidence for the magnetization reversal of the Néel caps around 120mT, with a ±20mT dispersion. No clear correlation could be found between the value of the reversal field and geometrical features of the dots.
- Publication:
-
Journal of Applied Physics
- Pub Date:
- April 2008
- DOI:
- 10.1063/1.2832332
- arXiv:
- arXiv:0802.0867
- Bibcode:
- 2008JAP...103gD915C
- Keywords:
-
- 75.50.Bb;
- 78.20.Ls;
- 75.60.Ej;
- 75.60.Jk;
- 79.60.Bm;
- Fe and its alloys;
- Magnetooptical effects;
- Magnetization curves hysteresis Barkhausen and related effects;
- Magnetization reversal mechanisms;
- Clean metal semiconductor and insulator surfaces;
- Condensed Matter - Materials Science
- E-Print:
- Journal of Applied Physics 103 (2008) 07D915