On the measurement by EDX of diffusion profiles of Ni/Cu assemblies
Abstract
To characterise (inter)diffusion in materials, concentration profiles can be measured by EDX. It allows one to determine the chemical composition with a very good accuracy if measurement artefacts are accounted for. Standard phenomena (such as X-ray fluorescence) are usually corrected by commercial software. However, the effect of the pear-shaped volume of X-ray emission on the concentration profiles has to be considered. The paper describes the origin of this artefact, its consequences on measurements and will provide a practical solution (based on signal processing methods) to deconvolute the actual concentration profiles (or the diffusion coefficient) from the raw measurements.
- Publication:
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arXiv e-prints
- Pub Date:
- December 2007
- DOI:
- 10.48550/arXiv.0712.3636
- arXiv:
- arXiv:0712.3636
- Bibcode:
- 2007arXiv0712.3636A
- Keywords:
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- Physics - Classical Physics
- E-Print:
- Microscopy and Analysis European Edition (2000) 13-15