Ti-rich and Cu-poor grain-boundary layers of CaCu3Ti4O12 detected by x-ray photoelectron spectroscopy
Abstract
Cleaved and polished surfaces of CaCu3Ti4O12 ceramics have been investigated by x-ray photoelectron spectroscopy (XPS) and energy dispersive x-ray spectroscopy (EDX), respectively. While EDX technique shows the identical CaCu3Ti4O12 stoichiometry for the two surfaces, XPS indicates that the cleaved surface with grain-boundary layers is remarkably Ti-rich and Cu-poor. The core-level spectrum of Cu 2p unambiguously shows the existence of monovalent copper only for the cleaved surface. Possible grain-boundary structure and its formation are discussed.
- Publication:
-
Applied Physics Letters
- Pub Date:
- July 2007
- DOI:
- 10.1063/1.2768006
- arXiv:
- arXiv:0708.2301
- Bibcode:
- 2007ApPhL..91e2910W
- Keywords:
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- Condensed Matter - Materials Science;
- Condensed Matter - Other
- E-Print:
- 8 pages, 3 figures