Calculating two-point resistances in distance-regular resistor networks
Abstract
An algorithm for the calculation of the resistance between two arbitrary nodes in an arbitrary distance-regular resistor network is provided, where the calculation is based on stratification introduced in Jafarizadeh and Salimi (2006 J. Phys. A: Math. Gen. 39 1-29) and the Stieltjes transform of the spectral distribution (Stieltjes function) associated with the network. It is shown that the resistances between a node α and all nodes β belonging to the same stratum with respect to the α (R_{\alpha\beta^{(i)}} , β belonging to the ith stratum with respect to the α) are the same. Also, the analytical formulae for two-point resistances R_{{\alpha\beta^{(i)}}}, i=1,2,3 , are given in terms of the size of the network and corresponding intersection numbers. In particular, the two-point resistances in a strongly regular network are given in terms of its parameters (v, κ, λ, μ). Moreover, the lower and upper bounds for two-point resistances in strongly regular networks are discussed.
- Publication:
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Journal of Physics A Mathematical General
- Pub Date:
- May 2007
- DOI:
- 10.1088/1751-8113/40/19/002
- arXiv:
- arXiv:0707.2570
- Bibcode:
- 2007JPhA...40.4949J
- Keywords:
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- Condensed Matter - Statistical Mechanics;
- Condensed Matter - Other Condensed Matter
- E-Print:
- 30 pages, 7 figures