Modeling the dependence of properties of ferroelectric thin film on thickness
Abstract
We present a segregated strain model that can describe the thickness-dependent dielectric properties of epitaxial ferroelectric films. Using a phenomenological Landau approach, we present results for two specific materials, making comparison with experiment and with first-principles calculations whenever possible. We also suggest a “smoking gun” benchtop probe to test our model.
- Publication:
-
Physical Review B
- Pub Date:
- July 2007
- DOI:
- 10.1103/PhysRevB.76.014112
- arXiv:
- arXiv:0704.2752
- Bibcode:
- 2007PhRvB..76a4112P
- Keywords:
-
- 77.22.-d;
- 77.55.+f;
- 77.80.Bh;
- Dielectric properties of solids and liquids;
- Dielectric thin films;
- Phase transitions and Curie point;
- Condensed Matter - Materials Science
- E-Print:
- 13 pages, 17 figures