The Research Progress of the Reflection Process in Black-Hole X-ray Binaries
Abstract
The reflection phenomenon is an important aspect in the study of black hole X-ray binaries, which helps to understand many unique physical processes in strong gravitational fields. In this paper, we present a comprehensive overview of the latest developments in the reflection components of black-hole X-ray binaries, covering observational and theoretical research. We begin by introducing the concept and formation mechanism of the reflection components. Subsequently, we summarize the recent discoveries of reflection components in various spectral states of black hole X-ray binaries and explore their physical properties. Next, we provide a detailed overview of the existing reflection models, with a particular emphasis on the recently developed "relxill" model. In addition, we also discuss some of the challenges and difficulties associated with studying reflection components, such as the uncertainty surrounding the thickness of the accretion disk and the properties of the corona. Finally, we conclude with a discussion of future research directions in the study of reflection components in black-hole X-ray binaries.
- Publication:
-
Progress in Astronomy
- Pub Date:
- March 2024
- DOI:
- 10.3969/j.issn.1000-8349.2024.01.04
- Bibcode:
- 2024PrA....42...58J
- Keywords:
-
- black-hole X-ray binaries;
- accretion;
- reflection