We experimentally study the real-time susceptibility of trapped-ion quantum systems to small doses of ionizing radiation. We expose an ion-trap apparatus to a variety of α, β, and γ sources and measure the resulting changes in trapped-ion qubit lifetimes, coherence times, gate fidelities, and motional heating rates. We found no quantifiable degradation of ion trap performance in the presence of low-dose radiation sources for any of the measurements performed. This finding is encouraging for the long-term prospects of using ion-based quantum information systems in extreme environments, indicating that much larger doses may be required to induce errors in trapped-ion quantum processors.
Journal of Physics B Atomic Molecular Physics
- Pub Date:
- July 2021
- Quantum Physics;
- Physics - Atomic Physics
- 10 pages, 3 figures, 1 table, slightly revised text