Emulating Radiation-Induced Multicell Upset Patterns in SRAM FPGAs With Fault Injection Perez-Celis, Andres ; Thurlow, Corbin ; Wirthlin, Michael Abstract Publication: IEEE Transactions on Nuclear Science Pub Date: August 2021 DOI: 10.1109/TNS.2021.3071704 Bibcode: 2021ITNS...68.1594P