In-situ nanoscale characterization of composition and structure during formation of ultrathin nickel silicide
Abstract
We characterize composition and structure of ultrathin nickel silicide during formation from 3 nm Ni films on Si(1 0 0) using in-situ high-resolution ion scattering and high-resolution transmission electron microscopy. We show the transition to occur in discrete steps, in which an intermediate phase is observed within a narrow range of temperature from 230 °C to 290 °C. The film composition of this intermediate phase is found to be 50% Ni:50% Si, without evidence for long-range structure, indicating the film to be a homogeneous monosilicide NiSi phase. The final phase is resemblant of the cubic disilicide NiSi2, but with slightly off-stoichiometric composition of 38% Ni and 62% Si. Along the [1 0 0] axis, the lattices of the film and the substrate are found in perfect alignment. Due to the epitaxial growth of the silicide, a contraction of the c lattice constant of the film by 0.7-1% is detected.
- Publication:
-
Applied Surface Science
- Pub Date:
- January 2021
- DOI:
- 10.1016/j.apsusc.2020.147781
- arXiv:
- arXiv:2006.12612
- Bibcode:
- 2021ApSS..53647781T
- Keywords:
-
- Ultrathin;
- Nickel silicide;
- Epitaxial silicide;
- In-situ characterization;
- High-resolution ion scattering;
- Condensed Matter - Materials Science
- E-Print:
- 17 pages, 6 figures