The Application of Atomic Force Microscopy to the Characterization of Geological Material Properties

Atomic force microscopy (AFM) is a powerful and versatile scanning probe microscopy with a resolution down to atomic scale, which has been widely applied in physics, chemistry, biology, and materials science. As a result of the high resolution and convenient analysis of transect, phases and particle size, AFM technology has allowed significant progress in the study of energy geological materials such as coal, shale, sandstone, clay minerals, and metal ore. It can not only investigate surface morphology of mineral crystals at the atomic scale, but also facilitate the in-situ observation of dissolution and precipitation of rocks and minerals in laboratory experiments. Besides, the unique measurement capacity of nanoscale mechanical properties is irreplaceable. In this study, recent applications of AFM in geosciences are critically reviewed, including surface topography, mechanical properties, surface dynamics, and state-of-the-art AFM-based infrared spectroscopy (AFM-IR). This work offers insight into the advantages and limitations of the AFM as well as the potential for artefacts to provide sources of creation and inspiration on how to join this advanced nanotechnology with geological research. The most promising development of AFM in the near future, i.e. standardization of set-ups, upscaling with other characterization techniques, combination with geochemical measurements, and more advanced environmental conditions for dynamic characterization, are further highlighted.