Determining the refractive index, absolute thickness and local slope of a thin transparent film using multi-wavelength and multi-incident-angle interference
Abstract
We describe a high-speed interferometric method, using multiple angles of incidence and multiple wavelengths, to measure the absolute thickness, tilt, the local angle between the surfaces, and the refractive index of a fluctuating transparent wedge. The method is well suited for biological, fluid and industrial applications.
- Publication:
-
Optics Express
- Pub Date:
- August 2020
- DOI:
- 10.1364/OE.397736
- arXiv:
- arXiv:2005.10437
- Bibcode:
- 2020OExpr..2824198H
- Keywords:
-
- Physics - Optics;
- Condensed Matter - Other Condensed Matter
- E-Print:
- 9 pages, 10 figures