The STIX Aspect System (SAS): The Optical Aspect System of the Spectrometer/Telescope for Imaging X-Rays (STIX) on Solar Orbiter
Abstract
The Spectrometer/Telescope for Imaging X-rays (STIX) is a remote sensing instrument on Solar Orbiter that observes the hard X-ray bremsstrahlung emission of solar flares. This paper describes the STIX Aspect System (SAS), a subunit that measures the pointing of STIX relative to the Sun with a precision of ±4″, which is required to accurately localize the reconstructed X-ray images on the Sun. The operating principle of the SAS is based on an optical lens that images the Sun onto a plate that is perforated by small apertures arranged in a cross-shaped configuration of four radial arms. The light passing through the apertures of each arm is detected by a photodiode. Variations of spacecraft pointing and of distance from the Sun cause the solar image to move over different apertures, leading to a modulation of the measured lightcurves. These signals are used by ground analysis to calculate the locations of the solar limb, and hence the pointing of the telescope.
- Publication:
-
Solar Physics
- Pub Date:
- July 2020
- DOI:
- 10.1007/s11207-020-01660-w
- Bibcode:
- 2020SoPh..295...90W
- Keywords:
-
- Instrumentation and data management;
- Flares;
- spectrum;
- X-ray bursts;
- Corona