Characterization of Ultra-Narrow Linewidth Lasers for Phase-Sensitive Coherent Reflectometry Using EOM Facilitated Heterodyning
Abstract
- Publication:
-
Journal of Lightwave Technology
- Pub Date:
- March 2020
- DOI:
- 10.1109/JLT.2019.2952688
- Bibcode:
- 2020JLwT...38.1446N