Effects of Interface Traps and Self-Heating on the Performance of GAA GaN Vertical Nanowire MOSFET
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- March 2020
- DOI:
- 10.1109/TED.2019.2963427
- Bibcode:
- 2020ITED...67..816T