A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm Liang, Zhen-Yu ; Wei, Hao-Hsuan ; Liu, Tsung-Te Abstract Publication: IEEE Journal of Solid-State Circuits Pub Date: March 2020 DOI: 10.1109/JSSC.2019.2942374 Bibcode: 2020IJSSC..55..817L