A Closed-Form Transient Joule Heating Model for an Interconnect in an Integrated Circuit Ahn, Woojin ; Zhang, Haojun ; Shen, Tian ; Justison, Patrick ; Alam, Muhammad Ashraful Abstract Publication: IEEE Electron Device Letters Pub Date: February 2020 DOI: 10.1109/LED.2019.2960060 Bibcode: 2020IEDL...41..288A