Modelling the properties of interstellar dust using the Si K-edge

The properties of interstellar dust (ID) can be studied in great detail by making use of X-ray spectroscopy techniques. The radiation of X-rays sources is scattered and absorbed by dust grains in the interstellar medium. The X-ray band is especially suitable to study silicates - one of the main components of ID -since it contains the absorption edges of Si, Mg, O and Fe. In the Galaxy, we can use absorption features in the spectra of X-ray binaries to study the size distribution, composition and crystalline structure of grains. In order to derive these properties, it is necessary to acquire a database of detailed extinction cross sections models, that reflects the composition of the dust in the interstellar medium. We present the extinction profiles of a set of newly acquired measurements of 14 dust analogues at the Soleil Synchrotron facility in Paris, where we focus on silicates and the Si-K edge in particular, which is modelled with unprecedented accuracy. These models are used to analyse ID in the dense environments of the Galaxy.