X-ray optics and beam characterization using random modulation: experiments
Abstract
The X-ray near-field speckle-based phase-sensing approach and its associated processing schemes are illustrated experimentally in the context of optics and beam characterization.
- Publication:
-
Journal of Synchrotron Radiation
- Pub Date:
- February 2020
- DOI:
- 10.1107/S1600577520000508FILE: /proj/ads/abstracts/
- arXiv:
- arXiv:1912.05432
- Bibcode:
- 2020JSynR..27..293B
- Keywords:
-
- speckle;
- near-field speckle-based phase-sensing;
- metrology;
- at-wavelength metrology;
- optics;
- Physics - Instrumentation and Detectors;
- Physics - Optics
- E-Print:
- 13 pages, 13 figures. arXiv admin note: substantial text overlap with arXiv:1902.09418